High-Resolution SEM

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SEM provides detailed images of surface morphology, surface contamination, grain structure, defects, and much more. Field Emission Scanning Electron Microscopy (SEM) provides high-resolution images with a depth-of-field. It is used to examine surface morphology, texture, defects, contamination, stains, grain size, porosity, and much more. Ultra High-Resolution Scanning Electron Microscopy provides images at resolutions below one nanometer and at very low beam energies.