High Resolution SEM

SEM provides detailed images of surface morphology, surface contamination, grain structure, defects and much more. Field Emission Scanning Electron Microscopy (SEM) provides high-resolution images with a depth-of-field. It is used to examine surface morphology, texture, defects, contamination, stains, grain size, porosity, and much more. Ultra High Resolution Scanning Electron Microscopy provides images at resolutions below one nanometer and at very low beam energies.

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